Defect Classes - An Overdue Paradigm for CMOS IC
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Using Target Faults To Detect Non-Tartget Defects
Proceedings of the IEEE International Test Conference on Test and Design Validity
Bridging Defects Resistance Measurements in a CMOS Process
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
All Tests for a Fault Are Not Equally Valuable for Defect Detection
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Test Strategy Sensitivity to Defect Parameters
Proceedings of the IEEE International Test Conference
CMOS Bridges and Resistive Transistor Faults: IDDQ versus Delay Effects
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Testing for bridging faults (shorts) in CMOS circuits
DAC '83 Proceedings of the 20th Design Automation Conference
The concept of resistance interval: a new parametric model for realistic resistive bridging fault
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
How Many Test Vectors We Need to Detect a Bridging Fault?
Journal of Electronic Testing: Theory and Applications
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Analyzing defect behavior is becoming increasingly difficult with the rising significance of defects that depend on random parameters. Such unpredictable parameters can affect various types of test escape. The concept of detection domains can help sort out the behavior of these test escapes.