Using Target Faults To Detect Non-Tartget Defects

Detection of Defects Using Fault Model Oriented Test Sequences

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

On Efficiently Producing Quality Tests forCustom Circuits in PowerPC™ Microprocessors

Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification

Improving Defect Detection in Static-Voltage Testing

IEEE Design & Test

On applying non-classical defect models to automated diagnosis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

IC diagnosis: preventing wars and war stories

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

Diagnostic Test Generation for Sequential Circuits

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Implicit Functionality and Multiple Branch Coverage (IFMB): a Testability Metric for RT-Level

ITC '01 Proceedings of the 2001 IEEE International Test Conference

A New Validation Methodology Combining Test and Formal Verification For PowerPC" Microprocessor Arrays

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects

ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design

Resistive Bridge Fault Modeling, Simulation and Test Generation

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Tradeoff Analysis For Producing High Quality Tests For Custom Circuits in PowerPCTM Microprocessors

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Modeling the Probability of Defect Excitation for a Commercial IC with Implications for Stuck-at Fault-Based ATPG Strategies

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Modeling Feedback Bridging Faults with Non-Zero Resistance

Journal of Electronic Testing: Theory and Applications

Test escapes: analysis of short defect

SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design