CMOS Bridges and Resistive Transistor Faults: IDDQ versus Delay Effects

Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation

ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design

Detection of Defects Using Fault Model Oriented Test Sequences

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

Modeling and simulation of real defects using fuzzy logic

Proceedings of the 37th Annual Design Automation Conference

Accurate CMOS bridge fault modeling with neural network-based VHDL saboteurs

Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design

Improving Defect Detection in Static-Voltage Testing

IEEE Design & Test

Replacing IDDQ Testing: With Variance Reduction

Journal of Electronic Testing: Theory and Applications

Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods

ETW '00 Proceedings of the IEEE European Test Workshop

Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods

ETW '00 Proceedings of the IEEE European Test Workshop

DELAY-FAULT TESTING AND DEFECTS IN DEEP SUB-MICRON ICS - DOES CRITICAL RESISTANCE REALLY MEAN ANYTHING?

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Test Strategy Sensitivity to Defect Parameters

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects

ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design

Modeling Feedback Bridging Faults with Non-Zero Resistance

Journal of Electronic Testing: Theory and Applications

Resistive bridging fault simulation of industrial circuits

Proceedings of the conference on Design, automation and test in Europe

SUPERB: Simulator utilizing parallel evaluation of resistive bridges

ACM Transactions on Design Automation of Electronic Systems (TODAES)

On-line error detection and fast recover techniques for dependable embedded processors

On-line error detection and fast recover techniques for dependable embedded processors

Defect classes - an overdue paradigm for CMOS IC testing

ITC'94 Proceedings of the 1994 international conference on Test

CδIDDQ: improving current-based testing and diagnosis through modified test pattern generation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Process-variation-aware Iddq diagnosis for nano-scale CMOS designs - the first step

Proceedings of the Conference on Design, Automation and Test in Europe