Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs

Quality considerations in delay fault testing

EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation

Detection of Defects Using Fault Model Oriented Test Sequences

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

Improving Defect Detection in Static-Voltage Testing

IEEE Design & Test

DELAY-FAULT TESTING AND DEFECTS IN DEEP SUB-MICRON ICS - DOES CRITICAL RESISTANCE REALLY MEAN ANYTHING?

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Test Strategy Sensitivity to Defect Parameters

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects

ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design

Modeling Feedback Bridging Faults with Non-Zero Resistance

Journal of Electronic Testing: Theory and Applications

Resistive bridging fault simulation of industrial circuits

Proceedings of the conference on Design, automation and test in Europe

SUPERB: Simulator utilizing parallel evaluation of resistive bridges

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Test escapes: analysis of short defect

SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design