Principles of CMOS VLSI design: a systems perspective
Principles of CMOS VLSI design: a systems perspective
Coverage of Delay Faults: When 13% and 99% Mean the Same
EDCC-1 Proceedings of the First European Dependable Computing Conference on Dependable Computing
Skewed-Load Transition Test: Part 1, Calculus
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
AC Test Quality: Beyond Transition Fault Coverage
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Skewed-Load Transition Test: Part 2, Coverage
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Delay Testing for Non-Robust Untestable Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
On diagnosis of pattern-dependent delay faults
Proceedings of the 37th Annual Design Automation Conference
On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A delay fault model for at-speed fault simulation and test generation
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
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