Quality considerations in delay fault testing
EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation
Generation of tenacious tests for small gate delay faults in combinational circuits
ATS '95 Proceedings of the 4th Asian Test Symposium
Propagation delay fault: a new fault model to test delay faults
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
On path delay testing in a standard scan environment
ITC'94 Proceedings of the 1994 international conference on Test
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