Accurate and efficient fault simulation of realistic CMOS network breaks
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
VHDL fault simulation for defect-oriented test and diagnosis of digital ICs
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
Fault simulation of interconnect opens in digital CMOS circuits
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Incorporating I_DDQ Testing with BIST forImproved Coverage: An Experimental Study
Journal of Electronic Testing: Theory and Applications
Detection of Defects Using Fault Model Oriented Test Sequences
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
A Low-Loss Built-In Current Sensor
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Modeling and simulation of real defects using fuzzy logic
Proceedings of the 37th Annual Design Automation Conference
Detectability Conditions of Full Opens in the Interconnections
Journal of Electronic Testing: Theory and Applications
Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems
Journal of Electronic Testing: Theory and Applications
LEAP: An Accurate Defect-Free IDDQ Estimator
Journal of Electronic Testing: Theory and Applications
Plug-and-Play IDDQ Testing for Test Fixtures
IEEE Design & Test
IDDQ Testing: Issues Present and Future
IEEE Design & Test
IC Failure Analysis: Magic, Mystery, and Science
IEEE Design & Test
Modeling the Unmodelable: Algorithmic Fault Diagnosis
IEEE Design & Test
Alpha 21164 Manufacturing Test Development and Coverage Analysis
IEEE Design & Test
Concurrent Checking of Clock Signal Correctness
IEEE Design & Test
Improving Defect Detection in Static-Voltage Testing
IEEE Design & Test
A fault diagnosis methodology for the UltraSPARC/sup TM/-I microprocessor
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Differential Sensing Strategy for Dynamic Thermal Testing of ICs
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
13.2 Sampling Techniques of Non-Equally Probable Faults in VLSI Systems
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Computer-Aided Fault to Defect Mapping (CAFDM) for Defect Diagnosis
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Test Method Evaluation Experiments & Data
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A BIST Approach for Very Deep Sub-Micron (VDSM) Defects
ITC '00 Proceedings of the 2000 IEEE International Test Conference
DECOUPLE: DEFECT CURRENT DETECTION IN DEEP SUBMICRON IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Testing for Resistive Opens and Stuck Opens
ITC '01 Proceedings of the 2001 IEEE International Test Conference
AN IDDQ SENSOR CIRCUIT FOR LOW-VOLTAGE ICS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IDD Pulse Response Testing Applied to Complex CMOS ICs
ITC '97 Proceedings of the 1997 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Test Strategy Sensitivity to Defect Parameters
ITC '97 Proceedings of the 1997 IEEE International Test Conference
APPLICATION AND ANALYSIS OF IDDQ DIAGNOSTIC SOFTWARE
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Signature Analysis for IC Diagnosis and Failure Analysis
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Experiences with Implementation of IDDQ Test for Identification and Automotive Products
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IDDQ Characterization in Submicron CMOS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Bridging Fault Diagnosis in the Absence of Physical Information
ITC '97 Proceedings of the 1997 IEEE International Test Conference
MANUFACTURING PATTERN DEVELOPMENT FOR THE ALPHA 21164 MICROPROCESSOR
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up
Journal of Electronic Testing: Theory and Applications
Yield Analysis of Logic Circuits
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Estimating detection probability of interconnect opens using stuck-at tests
Proceedings of the 14th ACM Great Lakes symposium on VLSI
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Detection probabilities of interconnect breaks: an analysis
Integration, the VLSI Journal - Special issue: ACM great lakes symposium on VLSI
Resistive bridging fault simulation of industrial circuits
Proceedings of the conference on Design, automation and test in Europe
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines
Journal of Electronic Testing: Theory and Applications
SUPERB: Simulator utilizing parallel evaluation of resistive bridges
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Detection probabilities of interconnect breaks: an analysis
Integration, the VLSI Journal - Special issue: ACM great lakes symposium on VLSI
Test escapes: analysis of short defect
SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design
QTAG: a standard for test fixture based IDDQ/ISSQ monitors
ITC'94 Proceedings of the 1994 international conference on Test
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