IDDQ testing as a component of a test suite: the need for several fault coverage metrics
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Reducing the CMOS RAM test complexity with IDDQ and voltage testing
Journal of Electronic Testing: Theory and Applications
Testing Defects in Scan Chains
IEEE Design & Test
Defect Classes - An Overdue Paradigm for CMOS IC
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Development of a CLASS 1 QTAG Monitor
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
An Off-chip IDDQ Current Measurement Unit for Telecommunication ASICs
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
A General Purpose IDDQ Measurement Circuit
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
A Serially Addressable, Flexible Current Monitor for Test Fixture Based IDDQ/ISSQ Testing
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Test Considerations for Gate Oxide Shorts in CMOS ICs
IEEE Design & Test
Inductive Fault Analysis of MOS Integrated Circuits
IEEE Design & Test
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This paper describes the goals and history of the Quality Test Artion Group (QTAG) since it was formed at the 1993 International Test Conference. QTAG was created to provide the industry with a de-facto standard for IDDQ/ISSQ monitors on test fixtures for production testing of CMOS ICs. The group was needed because informal discussions between the semiconductor test departments and the ATE vendors over the past decade had failed to generate the ATE based IDDQ test instrumentation needed by the semiconductor industry.