Test generation systems in Japan
DAC '75 Proceedings of the 12th Design Automation Conference
IDDQ Testing of Bridging Faults in Logic Resources of Reconfigurable Field Programmable Gate Arrays
IEEE Transactions on Computers
Detection of bridging faults in logic resources of configurable FPGAs using I_DDQ
ITC '98 Proceedings of the 1998 IEEE International Test Conference
QTAG: a standard for test fixture based IDDQ/ISSQ monitors
ITC'94 Proceedings of the 1994 international conference on Test
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Applying scan-based DFT, I/sub DDQ/ testing, or both to sequential circuits does not ensure bridging-fault detection, which depends on the resistance of the fault and circuit level parameters. With a "transparent" scan chain, however, the tester can use both methods to detect manufacturing process defects effectively-including difficult-to-detect shorts in the scan chain. The author presents a strategy for making the scan chain transparent. The test complexity of such a chain is very small, regardless of the number of flip-flops it contains.