IDDQ Testing of Opens in CMOS SRAMs
Journal of Electronic Testing: Theory and Applications
Open Defects in CMOS RAM Address Decoders
IEEE Design & Test
Test and Testability Techniques for Open Defects in RAM Address Decoders
EDTC '96 Proceedings of the 1996 European conference on Design and Test
6.1 IDDQ Testing of Opens in CMOS SRAMs
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
WEAK WRITE TEST MODE: AN SRAM CELL STABILITY DESIGN FOR TEST TECHNIQUE
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Methods for memory test time reduction
MTDT '96 Proceedings of the 1996 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '96)
QTAG: a standard for test fixture based IDDQ/ISSQ monitors
ITC'94 Proceedings of the 1994 international conference on Test
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