Optimal layout to avoid CMOS stuck-open faults
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Reducing the CMOS RAM test complexity with IDDQ and voltage testing
Journal of Electronic Testing: Theory and Applications
Development of Fault Model and Test Algorithms for Embedded DRAMs
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Test generation for MOS circuits using D-algorithm
DAC '83 Proceedings of the 20th Design Automation Conference
Diagnostic testing of embedded memories using BIST
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Detection of Delay Faults in Memory Address Decoders
Journal of Electronic Testing: Theory and Applications
Detection of CMOS address decoder open faults with March and pseudo random memory tests
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A Highly-Efficient Transparent Online Memory Test
ITC '01 Proceedings of the 2001 IEEE International Test Conference
March iC-: An Improved Version of March C- for ADOFs Detection
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test
Journal of Electronic Testing: Theory and Applications
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions
Journal of Electronic Testing: Theory and Applications
Opens and Delay Faults in CMOS RAM Address Decoders
IEEE Transactions on Computers
Analysis of resistive-open defects in SRAM sense amplifiers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time
Journal of Electronic Testing: Theory and Applications
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes
Journal of Electronic Testing: Theory and Applications
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Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these hard-to-detect defects