Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Detection of Delay Faults in Memory Address Decoders
Journal of Electronic Testing: Theory and Applications
Static and dynamic behavior of memory cell array opens and shorts in embedded DRAMs
Proceedings of the conference on Design, automation and test in Europe
Open Defects in CMOS RAM Address Decoders
IEEE Design & Test
Resistance Characterization for Weak Open Defects
IEEE Design & Test
Detection of CMOS address decoder open faults with March and pseudo random memory tests
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test and Testability Techniques for Open Defects in RAM Address Decoders
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Integration of Non-Classical Faults in Standard March Tests
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
Functional Memory Faults: A Formal Notation and a Taxonomy
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Tests for Resistive and Capacitive Defects in Address Decoders
ATS '01 Proceedings of the 10th Asian Test Symposium
A Microcode-Based Memory BIST Implementing Modified March Algorithm
ATS '01 Proceedings of the 10th Asian Test Symposium
Importance of Dynamic Faults for New SRAM Technologies
ETW '03 Proceedings of the 8th IEEE European Test Workshop
Memory testing with a RISC microcontroller
Proceedings of the Conference on Design, Automation and Test in Europe
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This paper presents a comparative analysis of ADOFs (Address Decoder Open Faults) and resistive-ADOFs in embedded-SRAMs. Such faults are the primary target of this study because they are hard-to-detect faults. These faults are caused by some particular defects which may appear in the parallel transistor network of the logic gates in the address decoders. With this study, we show that the test conditions required for ADOFs testing (sensitization and observation) are also useful for resistive-ADOFs detection, but more stringent timing requirements are needed. In the last part of the paper, we propose a study on the conditions to detect ADOFs with March tests. Moreover, we propose new March elements, which are effective for ADOF testing, and which can be added to existing March tests.