Functional Memory Faults: A Formal Notation and a Taxonomy

Authors:
Ad J. van de Goor;Zaid Al-Ars
Affiliations:
-;-
Venue:
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Year:
2000

Citing 0
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Abstract

This paper presents a notation for describing functional fault models, which may occur in memory devices. Using this notation, the space of all possible memory faults has been constructed. It has been shown that this space is infinite, and contains the currently established functional fault models. New fault models in this space have been identified and verified using resistive and capacitive defect injection and simulation of a DRAM model.