Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Deterministic tests for detecting single V-coupling faults in RAMs
Journal of Electronic Testing: Theory and Applications
March tests for word-oriented memories
Proceedings of the conference on Design, automation and test in Europe
Using March Tests to Test SRAMs
IEEE Design & Test
An experimental analysis of spot defects in SRAMs: realistic fault models and tests
ATS '00 Proceedings of the 9th Asian Test Symposium
March LA: a test for linked memory faults
EDTC '97 Proceedings of the 1997 European conference on Design and Test
March SS: A Test for All Static Simple RAM Faults
MTDT '02 Proceedings of the The 2002 IEEE International Workshop on Memory Technology, Design and Testing
March LR: a test for realistic linked faults
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Functional Memory Faults: A Formal Notation and a Taxonomy
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories
Journal of Electronic Testing: Theory and Applications
PPM Reduction on Embedded Memories in System on Chip
ETS '07 Proceedings of the 12th IEEE European Test Symposium
An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories
IEEE Transactions on Computers
Efficient Algorithms for Testing Semiconductor Random-Access Memories
IEEE Transactions on Computers
A March Test for Functional Faults in Semiconductor Random Access Memories
IEEE Transactions on Computers
On comparing functional fault coverage and defect coverage for memory testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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A fault primitive-based analysis of all static simple (i.e., not linked) three-cell coupling faults in nx1 random-access memories (RAMs) is discussed. All realistic static coupling faults that have been shown to exist in real designs are considered: state coupling faults, transition coupling faults, write disturb coupling faults, read destructive coupling faults, deceptive read destructive coupling faults, and incorrect read coupling faults. A new March test with 66n operations able to detect all static simple three-cell coupling faults is proposed. To compare this test with other industrial March tests, simulation results are also presented in this paper.