Exhaustive and Near-Exhaustive Memory Testing Techniques and theirBIST Implementations
Journal of Electronic Testing: Theory and Applications
Pseudo-exhaustive word-oriented DRAM testing
EDTC '95 Proceedings of the 1995 European conference on Design and Test
BIST for Embedded Word-Oriented DRAM
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
Built in self testing for detection of coupling faults in semiconductor memories
MTDT '96 Proceedings of the 1996 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '96)
MTDT '96 Proceedings of the 1996 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '96)
Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories
Journal of Electronic Testing: Theory and Applications
An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Crosstalk Induced Fault Analysis and Test in DRAMs
Journal of Electronic Testing: Theory and Applications
March test for static 3-coupling faults in random-access memories
DNCOCO'06 Proceedings of the 5th WSEAS international conference on Data networks, communications and computers
Hi-index | 0.00 |