Deterministic tests for detecting single V-coupling faults in RAMs
Journal of Electronic Testing: Theory and Applications
Theory of Transparent BIST for RAMs
IEEE Transactions on Computers
Symmetric transparent BIST for RAMs
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
Journal of Electronic Testing: Theory and Applications
A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM
Journal of Electronic Testing: Theory and Applications
Using March Tests to Test SRAMs
IEEE Design & Test
Industrial BIST of Embedded RAMs
IEEE Design & Test
A Programmable BIST Core for Embedded DRAM
IEEE Design & Test
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Transparent Memory Testing for Pattern-Sensitive Faults
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
DPSC SRAM Transparent Test Algorithm
ATS '02 Proceedings of the 11th Asian Test Symposium
Simulation and Development of Short Transparent Tests for RAM
ATS '01 Proceedings of the 10th Asian Test Symposium
| Hi-index | 0.00 |
Memory cores are usually the densest portion with the smallest feature size in system-on-chip (SOC) designs. The reliability of memory cores thus has heavy impact on the reliability of SOCs. Transparent test is one of useful technique for improving the reliability of memories during life time. This paper presents a systematic algorithm used for transforming a bit-oriented march test into a transparent word-oriented march test. The transformed transparent march test has shorter test complexity compared with that proposed in the previous works [Theory of transparent BIST for RAMs, A transparent online memory test for simultaneous detection of functional faults and soft errors in memories]. For example, if a memory with 32-bit words is tested with March C-, time complexity of the transparent word-oriented test transformed by the proposed scheme is only about 56% or 19% time complexity of the transparent word-oriented test converted by the scheme reported in [Theory of transparent BIST for RAMs] or [A transparent online memory test for simultaneous detection of functional faults and soft errors in memories], respectively.