March SS: A Test for All Static Simple RAM Faults

Authors:
Said Hamdioui;Ad J. van de Goor;Mike Rodgers
Affiliations:
-;-;-
Venue:
MTDT '02 Proceedings of the The 2002 IEEE International Workshop on Memory Technology, Design and Testing
Year:
2002

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Abstract

This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industrialmarch tests has the capability to detect all these faults. It therefore introduces a new test (March SS), with a test length of 22n, that detects all realistic simple static faults in RAMs.