Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
March tests for word-oriented memories
Proceedings of the conference on Design, automation and test in Europe
Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests
Journal of Electronic Testing: Theory and Applications
March SS: A Test for All Static Simple RAM Faults
MTDT '02 Proceedings of the The 2002 IEEE International Workshop on Memory Technology, Design and Testing
Functional Memory Faults: A Formal Notation and a Taxonomy
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Testing Static and Dynamic Faults in Random Access Memories
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Importance of Dynamic Faults for New SRAM Technologies
ETW '03 Proceedings of the 8th IEEE European Test Workshop
Dynamic Read Destructive Fault in Embedded-SRAMs: Analysis and March Test Solution
ETS '04 Proceedings of the European Test Symposium, Ninth IEEE
Automatic March Tests Generation for Static and Dynamic Faults in SRAMs
ETS '05 Proceedings of the 10th IEEE European Symposium on Test
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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The class of dynamic faults has been recently shown to be an important class of faults for the new technologies of Random Access Memories (RAM) with significant impact on defect-per-million (DPM) levels. Very little research has been done in the design of memory test algorithms targeting dynamic faults. Two March test algorithms of complexity 11N and 22N, N is the number of memory cells, for subclasses of two-operation single-cell and two-cell dynamic faults, respectively, were proposed recently [Benso et al., Proc., ITC 2005] improving the length of the corresponding tests proposed earlier [Hamdioui et al., Proc. of IEEE VLSI Test Symposium, pp. 395---400, 2002]. Also, a March test of length 100N was proposed [Benso et al., Proc. ETS 2005, Tallinn, pp. 122---127, 2005] for detection of two-cell dynamic faults with two fault-sensitizing operations both applied on the victim or aggressor cells. In this paper, for the first time, March test algorithms of minimum length are proposed for two-operation single-cell and two-cell dynamic faults. In particular, the previously known March test algorithm of length 100N for detection of two-operation two-cell dynamic faults is improved by 30N.