Testing Static and Dynamic Faults in Random Access Memories

Authors:
Said Hamdioui;Zaid Al-Ars;Ad J. van de Goor
Affiliations:
-;-;-
Venue:
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Year:
2002

Citing 0
Cited 10

Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests

Journal of Electronic Testing: Theory and Applications
Memory Fault Modeling Trends: A Case Study

Journal of Electronic Testing: Theory and Applications
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

Journal of Electronic Testing: Theory and Applications
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 μm and 90 nm technologies

Proceedings of the 42nd annual Design Automation Conference
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories

Journal of Electronic Testing: Theory and Applications
Crosstalk Induced Fault Analysis and Test in DRAMs

Journal of Electronic Testing: Theory and Applications
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories

Journal of Electronic Testing: Theory and Applications
A design-for-diagnosis technique for SRAM write drivers

Proceedings of the conference on Design, automation and test in Europe
Test set development for cache memory in modern microprocessors

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes

Journal of Electronic Testing: Theory and Applications

Quantified Score

Hi-index	0.00

Visualization

Abstract

The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored any more. It will be shown in this paper that conventional memory tests constructed to detect the static faulty behavior of a specific defect do not necessarily detect its dynamic faulty behavior; which has been shown to exist. The dynamic fault behavior can take place in the absence of the static fault behavior. The paper therefore also presents new memory tests derived to target the dynamic fault class.