Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Fault Location Algorithms for Repairable Embedded
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
March LR: a test for realistic linked faults
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Diagnostic testing of embedded memories using BIST
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Online and Offline BIST in IP-Core Design
IEEE Design & Test
An Effective Distributed BIST Architecture for RAMs
ETW '00 Proceedings of the IEEE European Test Workshop
Integration of Non-Classical Faults in Standard March Tests
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
Converting March Tests for Bit-Oriented Memories Into Tests for Word-Oriented Memories
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
A Programmable BIST Architecture for Clusters of Multiple-Port SRAMs
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores
Journal of Electronic Testing: Theory and Applications
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing
IEEE Transactions on Computers
HiBRID-SoC: A Multi-Core System-on-Chip Architecture for Multimedia Signal Processing Applications
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe: Designers' Forum - Volume 2
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories
Journal of Electronic Testing: Theory and Applications
A new march sequence to fit DDR SDRAM test in burst mode
Proceedings of the 21st annual symposium on Integrated circuits and system design
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Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e., read and write operations affect only a single bit in the memory. Traditionally, word-oriented memories have been tested by repeated application of a test for bit-oriented memories whereby a different data background (which depends on the used intra-word fault model) is used during each iteration. This results in time inefficiencies and limited fault coverage. A new approach for testing word-oriented memories is presented, distinguishing between inter-word and intra-word faults and allowing for a systematic way of converting tests for bit-oriented memories to tests for word-oriented memories. The conversion consists of concatenating the bit-oriented test for inter-word faults with a test for intra-word faults. This approach results in more efficient tests with complete coverage of the targeted faults. Because most memories have an external data path which is wider than one bit, word-oriented memory tests are very important.