Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Testing complex couplings in multiport memories
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
March tests for word-oriented memories
Proceedings of the conference on Design, automation and test in Europe
Serial Interfacing for Embedded-Memory Testing
IEEE Design & Test
Fault Location Algorithms for Repairable Embedded
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
March LR: a test for realistic linked faults
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Industrial evaluation of DRAM tests
DATE '99 Proceedings of the conference on Design, automation and test in Europe
March-Based RAM Diagnosis Algorithms for Stuck-At and Coupling Faults
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores
Journal of Electronic Testing: Theory and Applications
Crosstalk Induced Fault Analysis and Test in DRAMs
Journal of Electronic Testing: Theory and Applications
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