Industrial evaluation of DRAM tests

Authors:
Ad J. van de Goor;J. de Neef
Affiliations:
Faculty of Information Technology and Systems, Department of Electrical Engineering, Section Computer Architecture and Digital Technique, Delft University of Technology, Delft, The Netherlands;Faculty of Information Technology and Systems, Department of Electrical Engineering, Section Computer Architecture and Digital Technique, Delft University of Technology, Delft, The Netherlands
Venue:
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Year:
1999

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