Diagnosis and Repair of Memory with Coupling Faults
IEEE Transactions on Computers
Fault Diagnosis of RAMs from Random Testing Experiments
IEEE Transactions on Computers
Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Diagnostic testing of embedded memories using BIST
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Memory fault diagnosis by syndrome compression
Proceedings of the conference on Design, automation and test in Europe
Error catch and analysis for semiconductor memories using march tests
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM
Journal of Electronic Testing: Theory and Applications
Using March Tests to Test SRAMs
IEEE Design & Test
Built in self repair for embedded high density SRAM
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Fault Location Algorithms for Repairable Embedded
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
An experimental analysis of spot defects in SRAMs: realistic fault models and tests
ATS '00 Proceedings of the 9th Asian Test Symposium
A built-in self-test and self-diagnosis scheme for embedded SRAM
ATS '00 Proceedings of the 9th Asian Test Symposium
Adaptive Approaches for Fault Detection and Diagnosis of Interconnects of Random Access Memories
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
Converting March Tests for Bit-Oriented Memories Into Tests for Word-Oriented Memories
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
Maximal Diagnosis of Interconnects of Random Access Memories _
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
MTDT '96 Proceedings of the 1996 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '96)
Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Automatic Generation of Diagnostic March Tests
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
A March Test for Functional Faults in Semiconductor Random Access Memories
IEEE Transactions on Computers
On comparing functional fault coverage and defect coverage for memory testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Diagnosis technique plays a key role during the rapid developmentof the semiconductor memories, for catchingthe design and manufacturing failures and improving theoverall yield and quality. Investigation on efficient diagnosisalgorithms is very important due to the expensiveand complex fault/failure analysis process. We proposeMarch-based RAM diagnosis algorithms which not onlylocate faulty cells but also identify their types. The diagnosiscomplexity is O(17 N) and O((17 + 10 B)N) forbit-oriented and word-oriented diagnosis algorithms, respectively,where N represents the address number and Bis the data width. Using the proposed algorithms, stuck-atfaults, state coupling faults, idempotent coupling faultsand inversion coupling faults can be distinguished. Furthermore,the coupled and coupling cells can be locatedin the memory array. Our word-oriented diagnosis algorithmcan distinguish all of the inter-word and intra-wordcoupling faults, and locate the coupling cells of the intra-wordinversion and idempotent coupling faults. With addi-tional2B-1 operations, the algorithm can further locatethe intra-word state coupling faults. With improved diagnosticresolution and test time, the proposed algorithmsfacilitate the development and manufacturing of semiconductormemories.