A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM
Journal of Electronic Testing: Theory and Applications
March-Based RAM Diagnosis Algorithms for Stuck-At and Coupling Faults
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A data acquisition methodology for on-chip repair of embedded memories
ACM Transactions on Design Automation of Electronic Systems (TODAES)
FAME: A Fault-Pattern Based Memory Failure Analysis Framework
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing
IEEE Transactions on Computers
An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
| Hi-index | 0.00 |
A new approach to automatically generating diagnostic memory tests of linear order (O(N)) is presented. The resulting March tests provide complete detection and distinguishing of all single-cell and two-cell fault models. The approach is based on state transition graph modelling, decomposition of functional memory faults into basic fault effects, and output tracing. For each of the targeted basic fault effects, all possible March sequences are generated. A fast greedy-based algorithm is then used to compose diagnostic March tests from the set of March sequences. The proposed test generation algorithm was implemented in C. The results show that automatic generation can compete with hand-optimization of diagnostic March tests.