FAME: A Fault-Pattern Based Memory Failure Analysis Framework

Authors:
Kuo-Liang Cheng;Chih-Wea Wang;Jih-Nung Lee;Yung-Fa Chou;Chih-Tsun Huang;Cheng-Wen Wu
Affiliations:
National Tsing Hua University, Hsinchu, Taiwan;National Tsing Hua University, Hsinchu, Taiwan;National Tsing Hua University, Hsinchu, Taiwan;National Tsing Hua University, Hsinchu, Taiwan;National Tsing Hua University, Hsinchu, Taiwan;National Tsing Hua University, Hsinchu, Taiwan
Venue:
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Year:
2003

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Abstract

A memory failure analysis framework is developed-the FailureAnalyzer for MEmories (FAME). The FAME integrates the MemoryError Catch and Analysis (MECA) system and the Memory Defect Diagnostics(MDD) system. The fault-type based diagnostics approachused by MECA can improve the efficiency of the test and diagnosticalgorithms. The fault-pattern based diagnostics approach used byMDD further improves the defect identification capability. The FAMEalso comes with a powerful viewer for inspecting the failure patternsand fault patterns. It provides an easy way to narrow down the potentialcause of failures and identify possible defects more accuratelyduring the memory product development and yield ramp-up stage.An experiment has been done on an industrial case, demonstratingvery accurate results in a much shorter time as compared with theconventional way.