Automatic generation and compaction of March Tests for memory arrays
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - System Level Design
FAME: A Fault-Pattern Based Memory Failure Analysis Framework
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing
IEEE Transactions on Computers
Automatic march tests generations for static linked faults in SRAMs
Proceedings of the conference on Design, automation and test in Europe: Proceedings
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