Diagnosis and Repair of Memory with Coupling Faults
IEEE Transactions on Computers
Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Diagnostic testing of embedded memories using BIST
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Error catch and analysis for semiconductor memories using march tests
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM
Journal of Electronic Testing: Theory and Applications
Using March Tests to Test SRAMs
IEEE Design & Test
Built-In Self-Diagnosis for Repairable Embedded RAMs
IEEE Design & Test
Built in self repair for embedded high density SRAM
ITC '98 Proceedings of the 1998 IEEE International Test Conference
March-based RAM diagnosis algorithms for stuck-at and coupling faults
Proceedings of the IEEE International Test Conference 2001
Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield
IEEE Design & Test
A March-Based Fault Location Algorithm for Static Random Access Memories
MTDT '02 Proceedings of the The 2002 IEEE International Workshop on Memory Technology, Design and Testing
Embedded Memory Test and Repair: Infrastructure IP for SOC Yield
ITC '02 Proceedings of the 2002 IEEE International Test Conference
MTDT '96 Proceedings of the 1996 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '96)
An Approach for Evaluation of Redunancy Analysis Algorithms
MTDT '01 Proceedings of the International Workshop on Memory Technology, Design, and Testing (MTDT'01)
Automatic Generation of Diagnostic March Tests
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Raisin: Redundancy Analysis Algorithm Simulation
IEEE Design & Test
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This paper presents an efficient diagnosis scheme for RAMs. Three March-based algorithms are proposed to diagnose simple functional faults of RAMs. A March-15N algorithm is used for locating and partially diagnosing faults of bit-oriented or word-oriented memories, where N represents the address number. Then a 3N March-like algorithm is used for locating the aggressor words (bits) of coupling faults (CFs) in word-oriented (bit-oriented) memories. It also can distinguish the faults which cannot be identified by the March-15N algorithm. Thus, the proposed diagnosis scheme can achieve full diagnosis and locate aggressors with (15N+3mN) Read/Write operations for a bit-oriented RAM with m CFs. For word-oriented RAMs, a March-like algorithm is also proposed to locate the aggressor bit in the aggressor word with 4log2B Read/Write operations, where B is the word width. Analysis results show that the proposed diagnosis scheme has higher diagnostic resolution and lower time complexity than the previous fault location and fault diagnosis approaches. A programmable built-in self-diagnosis (BISD) design is also implemented to perform the proposed diagnosis algorithms. Experimental results show that the area overhead of the BISD is small — only about 2.17% and 0.42% for 16 K×8-bit and 16 K×128-bit SRAMs, respectively.