Memory fault diagnosis by syndrome compression
Proceedings of the conference on Design, automation and test in Europe
Error catch and analysis for semiconductor memories using march tests
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
Journal of Electronic Testing: Theory and Applications
March-Based RAM Diagnosis Algorithms for Stuck-At and Coupling Faults
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
Journal of Electronic Testing: Theory and Applications
A simple diagnostic method for memory testing
ICECS'03 Proceedings of the 2nd WSEAS International Conference on Electronics, Control and Signal Processing
A design-for-diagnosis technique for SRAM write drivers
Proceedings of the conference on Design, automation and test in Europe
An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
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Abstract: In this paper the following problems are considered : 1) march test's diagnostic capability estimation, ie. the type of the fault and it's location; 2) advanced march tests with diagnostic ability; 3) a march test with the same fault coverage as test March C and optimal diagnostic ability.