Spare allocation and reconfiguration in large area VLSI
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
Functional Testing of Semiconductor Random Access Memories
ACM Computing Surveys (CSUR)
Computers and Intractability: A Guide to the Theory of NP-Completeness
Computers and Intractability: A Guide to the Theory of NP-Completeness
Optimal Diagnosis Procedures for k-out-of-n Structures
IEEE Transactions on Computers
Memory fault diagnosis by syndrome compression
Proceedings of the conference on Design, automation and test in Europe
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
Journal of Electronic Testing: Theory and Applications
March-Based RAM Diagnosis Algorithms for Stuck-At and Coupling Faults
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A data acquisition methodology for on-chip repair of embedded memories
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A design-for-diagnosis technique for SRAM write drivers
Proceedings of the conference on Design, automation and test in Europe
An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Mathematical yield estimation for two-dimensional-redundancy memory arrays
Proceedings of the International Conference on Computer-Aided Design
Efficient online memory error assessment and circumvention for Linux with RAMpage
International Journal of Critical Computer-Based Systems
| Hi-index | 14.98 |
The problem of diagnosis and spare allocation for random-access memory (RAM) with coupling faults is addressed. A number of spare allocation algorithms for RAM with row and column redundancy have recently been proposed. These procedures, however, have been restricted to repair stuck-at faults. The authors examine both diagnosis and repair of coupling faults in RAMs utilizing spare rows and columns. It is shown that a coupling fault is repaired if its coupling cell is replaced by utilizing a spare row or its coupled cell is replaced by utilizing a spare row or column. By specifying both the coupled cell and coupling cell, the amount of redundancy required to repair a given set of faults may be reduced. A diagnosis procedure for RAM is provided to locate stuck-at faults as well as coupling faults. A graph model is used to describe the repair of coupling faults. A repair procedure has been implemented to allocate rows and columns for repair.