Fault Diagnosis of RAMs from Random Testing Experiments
IEEE Transactions on Computers
Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
March tests for word-oriented memories
Proceedings of the conference on Design, automation and test in Europe
Built-In Self-Diagnosis for Repairable Embedded RAMs
IEEE Design & Test
Open Defects in CMOS RAM Address Decoders
IEEE Design & Test
Detection of CMOS address decoder open faults with March and pseudo random memory tests
ITC '98 Proceedings of the 1998 IEEE International Test Conference
RAM Testing Algorithm for Detection Linked Coupling Faults
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Rambist builder: a methodology for automatic built-in self-test design of embedded rams
MTDT '96 Proceedings of the 1996 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '96)
Memory fault diagnosis by syndrome compression
Proceedings of the conference on Design, automation and test in Europe
Error catch and analysis for semiconductor memories using march tests
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
Journal of Electronic Testing: Theory and Applications
A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM
Journal of Electronic Testing: Theory and Applications
March-Based RAM Diagnosis Algorithms for Stuck-At and Coupling Faults
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A data acquisition methodology for on-chip repair of embedded memories
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
Journal of Electronic Testing: Theory and Applications
Raisin: Redundancy Analysis Algorithm Simulation
IEEE Design & Test
A System-layer Infrastructure for SoC Diagnosis
Journal of Electronic Testing: Theory and Applications
An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
High volume diagnosis in memory BIST based on compressed failure data
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Write disturbance modeling and testing for MRAM
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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