Random Pattern Testing Versus Deterministic Testing of RAMs
IEEE Transactions on Computers
Random Pattern Testing Versus Deterministic Testing of RAMs
IEEE Transactions on Computers
Diagnostic testing of embedded memories using BIST
DATE '00 Proceedings of the conference on Design, automation and test in Europe
March-Based RAM Diagnosis Algorithms for Stuck-At and Coupling Faults
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
Journal of Electronic Testing: Theory and Applications
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing
IEEE Transactions on Computers
A simple diagnostic method for memory testing
ICECS'03 Proceedings of the 2nd WSEAS International Conference on Electronics, Control and Signal Processing
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It is shown how random testing experiments can be used for fault diagnosis. Starting from a prescribed set of faults, the result of the first experiment allows the authors (1) to determine a subset of faults which are compatible with this result and (2) to choose the second experiment, and so on. An algorithm (each step of which is an experiment) is given, and simulation results are presented.