RAM Testing Algorithm for Detection Linked Coupling Faults

Authors:
V. G. Mikitjuk;V. N. Yarmolik;A. J. van de Goor
Affiliations:
Belorussian State Univ. of Informatics and Radioelectronics, P.Brovki 6, Minsk, Belarus;Belorussian State Univ. of Informatics and Radioelectronics, P.Brovki 6, Minsk, Belarus;Delft Univ. of Technology, P.O.Box 5031, 260O GA Delft, The Netherlands
Venue:
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Year:
1996

Citing 3
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Abstract

Many fault models for RAMs and tests for faults of these models are available. In most cases these tests allow for the detection of single faults only. This paper contains fault coverage analysis of march tests which detect multiple faults. It is shown there are faults which are not detected by any of the existing march tests. So we propose new march algorithms which cover multiple faults and particularly are effective to detect linked faults while, at the same time, having short test time.