Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
Journal of Electronic Testing: Theory and Applications
A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM
Journal of Electronic Testing: Theory and Applications
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure
IEEE Design & Test
Test, diagnosis and fault simulation of embedded RAM modules in SRAM-based FPGAs
Microelectronic Engineering
A design-for-diagnosis technique for SRAM write drivers
Proceedings of the conference on Design, automation and test in Europe
An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Testing comparison and delay faults of TCAMs with asymmetric cells
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Design techniques and test methodology for low-power TCAMs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Write disturbance modeling and testing for MRAM
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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