Open Defects in CMOS RAM Address Decoders
IEEE Design & Test
Fault Models and Tests for a 2-Bit-per-Cell MLDRAM
IEEE Design & Test
Test and Testability Techniques for Open Defects in RAM Address Decoders
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Exploit Analog IFA to Improve Specification Based Tests
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Fault Models and Test Strategies for a Two-Bit per Cell DRAM
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
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