Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Efficient testing of clock regenerator circuits in scan designs
DAC '97 Proceedings of the 34th annual Design Automation Conference
Detection of Defects Using Fault Model Oriented Test Sequences
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Defect Detection from Visual Abnormalities in Manufacturing Process Using IDDQ
Journal of Electronic Testing: Theory and Applications
Test Sets and Reject Rates: All Fault Coverages are Not Created Equal
IEEE Design & Test
Microprocessor IDDQ Testing: A Case Study
IEEE Design & Test
IDDQ Testing: Issues Present and Future
IEEE Design & Test
Enhanced testing performance via unbiased test sets
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Defect Detection from Visual abnormalities in Manufacturing Process Using IDDQ
ETW '00 Proceedings of the IEEE European Test Workshop
Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test Strategy Sensitivity to Defect Parameters
ITC '97 Proceedings of the 1997 IEEE International Test Conference
How Seriously Do You Take Possible-Detect Faults?
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
IDDQ Testing in Deep Submicron Integrated Circuits
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Graphical IDDQ signatures reduce defect level and yield loss
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
QTAG: a standard for test fixture based IDDQ/ISSQ monitors
ITC'94 Proceedings of the 1994 international conference on Test
A serially addressable, flexible current monitor for test fixture based IDDQ/ISSQtesting
ITC'94 Proceedings of the 1994 international conference on Test
Defect classes - an overdue paradigm for CMOS IC testing
ITC'94 Proceedings of the 1994 international conference on Test
Is IDDQ yield loss inevitable?
ITC'94 Proceedings of the 1994 international conference on Test
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