Test Sets and Reject Rates: All Fault Coverages are Not Created Equal

Authors:
Peter C. Maxwell;Robert C. Aitken
Affiliations:
-;-
Venue:
IEEE Design & Test
Year:
1993

Citing 4
Cited 16

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Abstract

The use of stuck-at-fault coverage for estimating overall quality levels is examined. Data from a part tested with both functional and scan tests are analyzed and compared with quality predictions generated by three existing theoretical models. It is shown that reasonable predictions are possible for functional tests, but that scan tests, due to misuse of theoretical equations, produce significantly worse quality levels than predicted.