Functional test generation for FSMs by fault extraction

Authors:
Bapiraju Vinnakota;Jason Andrews
Affiliations:
Department of Electrical Engineering, University of Minnesota, Minneapolis, MN;Tricod Systems Inc., Plymouth, MN and Department of Electrical Engineering, University of Minnesota, Minneapolis, MN
Venue:
DAC '94 Proceedings of the 31st annual Design Automation Conference
Year:
1994

Citing 2
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Abstract