Compact and complete test set generation for multiple stuck-faults
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
VHDL fault simulation for defect-oriented test and diagnosis of digital ICs
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
Simulation Techniques for the Manufacturing Test of MCMs
Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability
On Efficiently Producing Quality Tests forCustom Circuits in PowerPC™ Microprocessors
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Analysis of a BICS-Only Concurrent Error Detection Method
IEEE Transactions on Computers
Quality-effective repair of multichip module systems
Journal of Systems Architecture: the EUROMICRO Journal - Defect and fault tolerance in VLSI Systems
Test Sets and Reject Rates: All Fault Coverages are Not Created Equal
IEEE Design & Test
Progress in Design for Test: A Personal View
IEEE Design & Test
IEEE Design & Test
Sensitivity Analysis of Critical Parameters in Board Test
IEEE Design & Test
Defect-Oriented Testing and Defective-Part-Level Prediction
IEEE Design & Test
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect level prediction for I_DDQ testing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Synthesis of I/sub DDQ/-testable circuits: integrating built-in current sensors
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Iddq Testing for High Performance CMOS - The Next Ten Years
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods
ETW '00 Proceedings of the IEEE European Test Workshop
Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods
ETW '00 Proceedings of the IEEE European Test Workshop
A differential built-in current sensor design for high speed IDDQ testing
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test Method Evaluation Experiments & Data
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Comparing Functional and Structural Tests
ITC '00 Proceedings of the 2000 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
APPLICATION AND ANALYSIS OF IDDQ DIAGNOSTIC SOFTWARE
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Tradeoff Analysis For Producing High Quality Tests For Custom Circuits in PowerPCTM Microprocessors
ITC '99 Proceedings of the 1999 IEEE International Test Conference
ITC '99 Proceedings of the 1999 IEEE International Test Conference
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design
A serially addressable, flexible current monitor for test fixture based IDDQ/ISSQtesting
ITC'94 Proceedings of the 1994 international conference on Test
A test methodology to support an ASEM MCM foundry
ITC'94 Proceedings of the 1994 international conference on Test
Defects, fault coverage, yield and cost, in board manufacturing
ITC'94 Proceedings of the 1994 international conference on Test
The effect on quality of non-uniform fault coverage and fault probability
ITC'94 Proceedings of the 1994 international conference on Test
Manufacturing test simulator: a concurrent engineering tool for boards and MCMs
ITC'94 Proceedings of the 1994 international conference on Test
| Hi-index | 0.00 |