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Defect-Oriented Testing and Defective-Part-Level Prediction
IEEE Design & Test
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VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
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Proceedings of the conference on Design, automation and test in Europe
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In previous work, we have shown that optimizing the number ofsite observations leads to more defect detection. However, forincreasingly difficult defects, optimizing patterns for balancedrandom excitation also enhances test effectiveness. We can alsoreduce the effect of undetected defects by choosing tests thatminimize the likelihood of field failures.