A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults

Authors:
S. Lee;B. Cobb;J. Dworak;M. Grimaila;M. Mercer
Affiliations:
Department of Electrical Engineering, Computer Engineering Group, Texas A&M University, College Station, Texas;Department of Electrical Engineering, Computer Engineering Group, Texas A&M University, College Station, Texas;Department of Electrical Engineering, Computer Engineering Group, Texas A&M University, College Station, Texas;Department of Electrical Engineering, Computer Engineering Group, Texas A&M University, College Station, Texas;Department of Electrical Engineering, Computer Engineering Group, Texas A&M University, College Station, Texas
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2002

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Abstract

Deterministic observation and random excitation of faultsites during the ATPG process dramatically reduces theoverall defective part level. However, multiple observationsof each fault site lead to increased test set size and requiremore tester memory. In this paper, we propose a new ATPGalgorithm to find a near-minimal test pattern set that detectsfaults multiple times and achieves excellent defectivepart level. This greedy approach uses 3-value fault simulationto estimate the potential value of each vector candidateat each stage of ATPG. The result shows generation of aclose to minimal vector set is possible only using dynamiccompaction techniques in most cases. Finally, a systematicmethod to trade-off between defective part level and test sizeis also presented.