Universal fault simulation using fault tuples
Proceedings of the 37th Annual Design Automation Conference
An Experimental Chip to Evaluate Test Techniques: Experiment Results
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
On the effects of test compaction on defect coverage
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
A Technique for Logic Fault Diagnosis of Interconnect Open Defects
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
Proceedings of the conference on Design, automation and test in Europe
A Measure of Quality for n-Detection Test Sets
IEEE Transactions on Computers
On the Size and Generation of Minimal N-Detection Tests
VLSID '06 Proceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor
ITC '04 Proceedings of the International Test Conference on International Test Conference
Multiple-detect ATPG based on physical neighborhoods
Proceedings of the 43rd annual Design Automation Conference
Defect Level as a Function of Fault Coverage
IEEE Transactions on Computers
Defect Modeling Using Fault Tuples
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Generation of compact test sets with high defect coverage
Proceedings of the Conference on Design, Automation and Test in Europe
Statistical defect-detection analysis of test sets using readily-available tester data
Proceedings of the International Conference on Computer-Aided Design
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N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of N-detect test do not necessarily exploit the localized characteristics of defects. In physically-aware N-detect test, the objective is to ensure that the N tests establish N different logical states on the signal lines that are in the physical neighborhood surrounding the targeted fault site. We present a test selection procedure for creating a physically-aware N-detect test set that satisfies a user-provided constraint on test-set size. Results produced for an industrial test chip demonstrate the effectiveness and practicability of our pattern selection approach. Specifically, we show that we can virtually detect the same number of faults 10 or more times as a traditional 10-detect test set and increase the number of neighborhood states and the number of faults with 10 or more states by 18.0 and 4.7%, respectively, without increasing the number of tests over a traditional 10-detect test set.