Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor

Authors:
M. Enamul Amyeen;Srikanth Venkataraman;Ajay Ojha;Sangbong Lee
Affiliations:
Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR;Intel Corporation, Hillsboro, OR
Venue:
ITC '04 Proceedings of the International Test Conference on International Test Conference
Year:
2004

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Abstract

This paper evaluates N-detect scan ATPG patterns for their impact to test quality through simulation and fallout from production on a Pentium 4 processor using 90nm manufacturing technology. An incremental ATPG flow is used to generate N-detect test patterns. The generated patterns were applied in production with flows to determine overlap in fallout to different tests. The generated N-detect test patterns are then evaluated based on different metrics. The metrics include signal states, bridge fault coverage, stuck-at fault coverage and fault detection profile. The correlation between the different metrics is studied. Data from production fallout shows the effectiveness of N-detect tests. Further, the correlation between fallout data and the different metrics is analyzed.