Logic Synthesis and Verification Algorithms
Logic Synthesis and Verification Algorithms
An Experimental Chip to Evaluate Test Techniques: Experiment Results
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
On the effects of test compaction on defect coverage
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
Proceedings of the conference on Design, automation and test in Europe
Independent Test Sequence Compaction through Integer Programming
ICCD '03 Proceedings of the 21st International Conference on Computer Design
Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor
ITC '04 Proceedings of the International Test Conference on International Test Conference
Deviation-based LFSR reseeding for test-data compression
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Compacting test vector sets via strategic use of implications
Proceedings of the 2009 International Conference on Computer-Aided Design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults
Journal of Electronic Testing: Theory and Applications
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In this paper, we illustrate that the traditional Ndetect ATPG is unoptimized in terms of the size of the generated pattern set. The optimization problem is formulated as a minimum covering problem. Integer Linear Programming (ILP) is applied to obtain an Ndetection ATPG pattern set with the minimum number of patterns. A heuristic method is also proposed to obtain sub-optimal solutions efficiently. Experimental results demonstrate that by using the proposed method, the number of N-detection patterns can be reduced by about 18% for N=3 and about 13% for N=5 without compromising N-detection objective.