Location of Stuck-At Faults and Bridging Faults Based on Circuit Partitioning
IEEE Transactions on Computers
On the Use of Fully Specified Initial States for Testing of Synchronous Sequential Circuits
IEEE Transactions on Computers
On Using Twisted-Ring Counters for Test Set Embedding in BIST
Journal of Electronic Testing: Theory and Applications
On improving genetic optimization based test generation
EDTC '97 Proceedings of the 1997 European conference on Design and Test
On Full Reset as a Design-For-Testability Technique
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
On n-detection test sequences for synchronous sequential circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
13.3 Stuck-At Tuple-Detection: A Fault Model Based on Stuck-At Faults for Improved Defect Coverage
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
On the Evaluation of Arbitrary Defect Coverage of Test Sets
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
On Test Application Time and Defect Detection Capabilities of Test Sets for Scan Designs
ICCD '00 Proceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors
IEEE Transactions on Computers
On N-Detect Pattern Set Optimization
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Test data compression scheme based on variable-to-fixed-plus-variable-length coding
Journal of Systems Architecture: the EUROMICRO Journal
Physically-aware N-detect test pattern selection
Proceedings of the conference on Design, automation and test in Europe
Test data compression using alternating variable run-length code
Integration, the VLSI Journal
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We study the effects of test compaction on the defect coverage of test sets for modeled faults. Using a framework proposed earlier, defects are represented by surrogate faults. Within this framework, we show that the defect coverage does not have to be sacrificed by test compaction, if the test set is computed using appropriate test generation objectives. Moreover, two test sets, one compacted and one non-compacted, generated using the same test generation objectives, typically have similar defect coverages, even if the compacted one is significantly smaller than the uncompacted one. Test generation procedures and experimental results to support these claims are presented.