An Experimental Chip to Evaluate Test Techniques: Experiment Results
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
On the effects of test compaction on defect coverage
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
On the decline of testing efficiency as fault coverage approaches 100%
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Test Resource Partitioning for SOCs
IEEE Design & Test
On the Evaluation of Arbitrary Defect Coverage of Test Sets
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
IEEE Transactions on Computers
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Generation of broadside transition fault test sets that detect four-way bridging faults
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Test data compression scheme based on variable-to-fixed-plus-variable-length coding
Journal of Systems Architecture: the EUROMICRO Journal
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N-detection stuck-at test sets were shown to be effective in achieving high defect coverages for benchmark circuits. However, the definition of n-detection test sets allows the same set of faults to be detected by several different tests, thus potentially detecting the same defects. We propose an extension of the n- detection model that alleviates this problem by considering m- tuples of faults and requiring that different tests would detect different m-tuples. We present experimental results to support this model.