Test Resource Partitioning for SOCs

Authors:
Anshuman Chandra;Krishnendu Chakrabarty
Affiliations:
-;-
Venue:
IEEE Design & Test
Year:
2001

Citing 10
Cited 10

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DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
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Frugal linear network-based test decompression for drastic test cost reductions

Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Test resource partitioning based on efficient response compaction for test time and tester channels reduction

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Test data compression scheme based on variable-to-fixed-plus-variable-length coding

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Diagnosis of logic circuits using compressed deterministic data and on-chip response comparison

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Abstract

A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test quality.