An Experimental Chip to Evaluate Test Techniques: Experiment Results
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%?
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
High-coverage ATPG for datapath circuits with unimplemented blocks
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On the effects of test compaction on defect coverage
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
13.3 Stuck-At Tuple-Detection: A Fault Model Based on Stuck-At Faults for Improved Defect Coverage
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
On the decline of testing efficiency as fault coverage approaches 100%
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Derivation of Minimum Test Sets for Unate Logical Circuits
IEEE Transactions on Computers
Universal Test Sets for Logic Networks
IEEE Transactions on Computers
Error Diagnosis of Sequential Circuits Using Region-Based Model
Journal of Electronic Testing: Theory and Applications
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Efficient methods to evaluate the quality of a test set in terms of its coverage of arbitrary defects in a circuit are presented. Our techniques rapidly estimate arbitrary defect coverage because they are independent of specific, physical, fault models. We overcome the potentially explosive computational requirements associated with considering all possible defects by implicitly evaluating multiple faults (of all types) simultaneously and by exploiting the local nature of defects. Our experiments show that a strong correlation exists between stuck-at fault coverage and defects whose behavior is independent of the input vectors. Our techniques are capable of identifying regions in the circuit where defects may escape the test set. We also demonstrate how the chances of detection of an arbitrary defect by a test set vary when a single stuck-at-fault within the vicinity of that defect is detected multiple times by the test set.