Defect Classes - An Overdue Paradigm for CMOS IC
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
On Efficiently and Reliably Achieving Low Defective Part Levels
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Finding Defects with Fault Models
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Physical DFT for High Coverage of Realistic Faults
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need?
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Testing CMOS Logic Gates for Realistic Shorts
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Test preparation for high coverage of physical defects in CMOS digital ICs
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
A VHDL error simulator for functional test generation
DATE '00 Proceedings of the conference on Design, automation and test in Europe
AMLETO: A Multi-language Environment for Functional Test Generation
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting
Journal of Electronic Testing: Theory and Applications
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