On Efficiently and Reliably Achieving Low Defective Part Levels

VHDL fault simulation for defect-oriented test and diagnosis of digital ICs

EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation

Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems

Journal of Electronic Testing: Theory and Applications

On applying non-classical defect models to automated diagnosis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

13.2 Sampling Techniques of Non-Equally Probable Faults in VLSI Systems

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium

A Comparison of Bridging Fault Simulation Methods

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Defect Aware Test Patterns

Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects

Journal of Electronic Testing: Theory and Applications