Verification of synchronous sequential machines based on symbolic execution
Proceedings of the international workshop on Automatic verification methods for finite state systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Automatic generation of functional vectors using the extended finite state machine model
ACM Transactions on Design Automation of Electronic Systems (TODAES)
VHDL fault simulation for defect-oriented test and diagnosis of digital ICs
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
A fault model for VHDL descriptions at the register transfer level
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
Functional vector generation for HDL models using linear programming and 3-satisfiability
DAC '98 Proceedings of the 35th annual Design Automation Conference
The Verilog hardware description language (4th ed.)
The Verilog hardware description language (4th ed.)
Simulation vector generation from HDL descriptions for observability-enhanced statement coverage
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Fast sequential circuit test generation using high-level and gate-level techniques
Proceedings of the conference on Design, automation and test in Europe
Art of Software Testing
Implicit test generation for behavioral VHDL models
ITC '98 Proceedings of the 1998 IEEE International Test Conference
An error simulation based approach to measure error coverage of formal properties
Proceedings of the 12th ACM Great Lakes symposium on VLSI
Behavioral test generation for the selection of BIST Logic
Journal of Systems Architecture: the EUROMICRO Journal - Defect and fault tolerance in VLSI Systems
ARPIA: A High-Level Evolutionary Test Signal Generator
Proceedings of the EvoWorkshops on Applications of Evolutionary Computing
A Method Enabling Feasible Conformance Test Sequence Generation for EFSM Models
IEEE Transactions on Computers
Electronic Notes in Theoretical Computer Science (ENTCS)
A probabilistic analysis method for functional qualification under mutation analysis
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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